The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2003

Filed:

Nov. 22, 2000
Applicant:
Inventors:

Yuanhua Tom Tang, San Jose, CA (US);

Yonghong Grace Yang, San Jose, CA (US);

Assignee:

GenMetrics, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/730 ; G06F 7/00 ;
U.S. Cl.
CPC ...
G06F 1/730 ; G06F 7/00 ;
Abstract

Systems and methods for generating indexes and fast searching of “approximate”, “fuzzy”, or “homologous” matches for a large quantity of data in a metric space are provided. The data is indexed to generate a search tree taxonomy. Once the index is generated, a query can be provided to report all hits within a certain neighborhood of the query. In an even faster implementation, the invention may be used together with existing approximate sequence comparison algorithms, such as FASTA and BLAST. Here, a local distance of a local metric space is used to generate local search tree branches. Applications of this invention may include homology search for DNA and/or protein sequences, textual or byte-based searches, literature search based on lists of keywords, and vector and matrix based indexing and searching.


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