The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6636816 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 21, 2003

Filed:

Oct. 09, 2001
Applicant:
Inventors:

Steven L. Dvorak, Tucson, AZ (US);

Ben K. Sternberg, Tucson, AZ (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract

An error-suppression signal measurement system and method therefor is provided. The system transmits a test signal from a first probe, through a device under test, and into a second probe. The probes extract normalization signals from reference signals therein, exchange specific ones of the normalization signals, and combine the normalization signals with data signals derived from the test signal to form receiver signals. The probes propagate the receiver signals to a receiver, where the signals are gain-ranged, digitized, normalized, and compensated for phase-noise.


Find Patent Forward Citations

Dvorak, Steven. (2003). Vector signal analysis method and apparatus therefor (U.S. Patent No. 6636816). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6636816

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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