The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2003
Filed:
Jan. 19, 2000
Applicant:
Inventors:
Yao Rong Wang, Webster, NY (US);
Lingappa K. Mestha, Fairport, NY (US);
Daniel Edgardo Viassolo, Penfield, NY (US);
Sohail A. Dianat, Pittsford, NY (US);
Assignee:
Xerox Corporation, Stamford, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract
This invention provides an iteratively clustered interpolation (ICI) algorithm for use with irregularly sampled color data to develop a structured inverse. This algorithm improves device independent color across devices, such as, for example, printers, scanners and displays.
Wang, Yao. (2003). Iteratively clustered interpolation for geometrical interpolation of an irregularly spaced multidimensional color space (U.S. Patent No. 6636628). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6636628
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile