The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2003
Filed:
Apr. 17, 2000
Dat Nguyen, San Jose, CA (US);
James Wilson Rae, Rochester, MN (US);
Infineon Technologies North America Corp., San Jose, CA (US);
Abstract
Systems and methods for accumulating data relating to the performance of one or more components of a read channel are described. In one aspect, a programmable channel quality monitor is operable to accumulate performance data corresponding to a recorded test data sequence spanning two or more data sectors of the magnetic medium. The channel quality monitor preferably is incorporated in a disk drive system. A method of accumulating performance data from a read channel also is described. In accordance with this inventive method, an original test data pattern is written to multiple data sectors of the magnetic medium. The original test pattern is read from the multiple data sectors of the magnetic medium to produce a readback test pattern. In this method, performance data relating to a comparison of the original test pattern and the readback test pattern is accumulated.