The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2003

Filed:

Jul. 19, 2000
Applicant:
Inventors:

Yoshihiro Hama, Saitama-ken, JP;

Yasushi Suzuki, Saitama-ken, JP;

Taminori Odano, Saitama-ken, JP;

Susumu Mikajiri, Chiba-ken, JP;

Assignee:

Pentax Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/608 ;
U.S. Cl.
CPC ...
G02B 2/608 ;
Abstract

A multi-beam scanning device is provided with a light source that emits a plurality of light beams, a polygonal mirror that deflects the light beams emitted by the light source to scan, and an optical system that converges the deflected light beams on a plurality of objects to be scanned. The optical system includes an optical path turning system that turns optical paths of the deflected light beams, respectively. The optical path turning system is constructed such that optical path lengths of the optical path of the deflected light beams are the same, and one of the optical paths directed to an object located farthest from the polygonal mirror consists of two linear paths and one turning portion at which a beam is deflected.


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