The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2003
Filed:
Jul. 26, 2002
Applicant:
Inventor:
Jorge Salcedo-Suner, Allen, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/126 ;
Abstract
A reliable method of testing a CMOS-based integrated circuit device having a low-impedance path between I/O pin(s) and GND for potential micro-latch-up. The test method detects a low impedance path between the integrated circuit device I/O pin(s) and GND(s) caused by a parasitic SCR that is not detectable using conventional latch-up detection test methods.