The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2003

Filed:

Apr. 19, 2001
Applicant:
Inventors:

Jürgen Kunze, Paderborn, DE;

Gunter Schepp, Butzbach, DE;

Jan Weber, Heuchelheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/300 ; G01R 3/302 ; G01R 3/307 ;
U.S. Cl.
CPC ...
G01R 3/300 ; G01R 3/302 ; G01R 3/307 ;
Abstract

Magnetic field gradients are used e.g., for potential-free current measurement without voluminous ferrite cores to minimize the influence of homogenous external interference fields on the measurement. So far, they have been provided mainly through U-shaped primary current conductors. The aim is to make it unnecessary to guide high currents through U-shaped current conductors, and to provide a device and a method for creating one or more magnetic field gradients through a straight conductor. To this end, a primary current conductor which is straight at the point where the magnetic field is measured has a recess or groove or slot for creating a magnetic field gradient. Inside or in the area surrounding this recess, the field lines take a course that enables one or more gradiometers to be positioned so that the influences of especially homogenous interference fields on the measurements are successfully minimized using simple mathematical methods such as subtraction.


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