The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2003
Filed:
Jul. 13, 2001
Applicant:
Inventor:
B. Mark Hirst, Boise, ID (US);
Assignee:
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/14 ;
U.S. Cl.
CPC ...
H01J 3/14 ;
Abstract
A method for determining a scan line error for a scan line, wherein the scan line is produced from one of a plurality of facets of a rotating reflector of a scanning device. The method comprises the steps of (a) determining a difference between a time of an occurrence of a point in a scan line produced from a first facet and a time of an occurrence of a point in a scan line produced from a second facet, and (b) determining from the difference, a scan line error for the scan line produced from the first facet.