The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2003
Filed:
May. 20, 2002
Dirk Hauer, Heidenheim, DE;
Berndt Hoetzel, Woerrstadt, DE;
Schott Glas, Mainz, DE;
Abstract
The method of making a freeform cut on a work piece made of brittle material, such as glass, includes producing a linear focal point from a laser beam and a cold spot following the linear focal point on the work piece so that at least 60 percent of a laser beam energy output is concentrated at opposite ends of the linear focal point; moving the linear focal point along a specified contour for forming the cut and adjusting a length of the focal point according to a contour line curvature, so that the opposite ends lie on the contour, even when the contour is curved, in order to make the freeform cut. The device for performing this method includes a numerical trajectory control device ( ) for positioning the linear focal point as it moves along the contour and a profile control device ( ) cooperating with the numerical trajectory control device ( ) for controlling a length (S) of the linear focal point ( ).