The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2003

Filed:

Aug. 10, 2001
Applicant:
Inventors:

Carl T. Wittwer, Salt Lake City, UT (US);

Andrew O. Crockett, West Valley, UT (US);

Brian E. Caplin, Salt Lake City, UT (US);

Wade Stevenson, West Jordan, UT (US);

Jian Chen, Sandy, UT (US);

Noriko Kusukawa, Salt Lake City, UT (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ; C07H 2/104 ;
U.S. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ; C07H 2/104 ;
Abstract

Probes and methods are provided for detection and analysis of nucleic acid sequences. The probes are single-labeled oligonucleotide probes whose fluorescence emission changes in response to probe-target hybridization and dissociation. The methods are for analyzing one or multiple nucleic acid loci using the probes. This invention further relates to the use of fluorescence changes in single-labeled probes for melting curve analysis, genotyping, and pathogen detection, and to methods for quantification of specific sequences in real-time monitoring of nucleic acid amplification.


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