The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2003

Filed:

Nov. 02, 2000
Applicant:
Inventors:

Dagobert Michel De Leeuw, Eindhoven, NL;

Gerwin Hermanus Gelinck, Eindhoven, NL;

Marco Matters, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/100 ; H01L 2/900 ; G03F 7/00 ;
U.S. Cl.
CPC ...
H01L 2/100 ; H01L 2/900 ; G03F 7/00 ;
Abstract

The present invention provides a method of photochemically producing a vertical interconnect between a first and a second thin-film microelectronic device in an vertical interconnect area which comprises an overlap of a stack of a first electrically conducting area, optionally an organic electrically semiconducting area, an organic electrically insulating area comprising adapted photoresist material and a second organic electrically conducting area, wherein the organic electrically insulating area is removed within the overlapping area and substituted by an electrically conducting area which is extended from at least said first or said second electrically conducting area. The method is useful in the manufacture of electronic devices, preferably integrated circuits, consisting substantially of organic materials.


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