The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2003
Filed:
May. 01, 2000
Dean T. Lindsay, Milpitas, CA (US);
John A. Benavides, Garland, TX (US);
Kenneth D. Holloway, San Jose, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A system and method for testing at least one interface of a digital integrated circuit while at least one other interface of the digital integrated circuit operates in a normal mode is disclosed. Each interface includes at least one boundary scan cell such that each boundary scan cell is electrically coupled to a pin of the digital integrated circuit. The method includes selectively categorizing at least one interface into a first category. At least one other interface is selectively categorized into a second category. A first mode signal is provided to the interfaces categorized into the test mode category such that the interfaces categorized into the test mode category operate in a test mode. A second mode signal is provided to the interfaces categorized into the normal operation mode category such that the interfaces categorized into the normal operation mode category operate in a normal operation mode.