The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2003
Filed:
Jan. 29, 2001
Applicant:
Inventor:
Yuri Gartstein, Webster, NY (US);
Assignee:
Xerox Corporation, Stamford, CT (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract
Systems and methods are provided for optimizing a production facility that includes workstations for producing products. The method involves utilizing an objective function to find optimal production rates of the products.
Gartstein, Yuri. (2003). Systems and methods for optimizing a production facility (U.S. Patent No. 6633790). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6633790
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile