The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2003
Filed:
Nov. 23, 1999
Jean Lienard, Clamart, FR;
Serge Muller, Guyancourt, FR;
François Nicholas, Palaiseau, FR;
Fabienne Betting, Paris, FR;
GE Medical Systems, Buc, FR;
Abstract
A method of compensation for the thickness of an organ in an X-ray machine of the type comprising an X-ray source and a detector of the beam of X-rays after it has passed through the organ, the detector being capable of converting the X-ray beam into a digital electronic signal, in which, from a digitized image, an image of the radiologic thicknesses of an organ traversed by the X-ray beam is calculated, a thickness threshold is defined, from this there is derived an algebraic compensation image to bring the pixels of a level below or above the threshold back to the value of the threshold, and the thickness image and a proportion of the compensation image are summed up, to obtain a compensated thickness image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile