The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2003
Filed:
Jan. 25, 2000
Applicant:
Inventor:
John Carl Schotland, Ladue, St. Louis County, MO (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 ; G01J 5/02 ; G01N 2/100 ;
U.S. Cl.
CPC ...
G06K 9/36 ; G01J 5/02 ; G01N 2/100 ;
Abstract
A method for the direct reconstruction of an object from measurements, called scattering data, of scattered waves due to probing waves as emitted by a source. The scattering data is related to a scattering kernel by an integral operator. The image is directly reconstructed by executing a prescribed mathematical algorithm, as determined with reference to the integral operator, on the scattering data.
Schotland, John. (2003). Near-field tomography (U.S. Patent No. 6633660). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6633660
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile