The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2003

Filed:

Sep. 15, 2000
Applicant:
Inventors:

Raanan Ben-Zur, Campbell, CA (US);

Sandra Maria Frazier, Union City, CA (US);

Shi-Woang Wang, Fremont, CA (US);

Assignee:

Ciena Corporation, Linthicum, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 5/22 ;
U.S. Cl.
CPC ...
H04L 5/22 ;
Abstract

A method and apparatus for generating massive interrupts in random access memory (RAM) are provided, comprising receiving and storing Time Slot network (TS Net) data frames comprising switching event information in a first RAM area. Compare operations are performed among prespecified ones of the TS Net data frames. Unit interrupt bits are set in a corresponding location of a second RAM area in response to detected bit differences resulting from the compare operations. Interrupt status bits are set in a corresponding location of a third RAM area in response to set unit interrupt bits. Massive interrupt signals are generated in response to set unit interrupt bit.


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