The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2003
Filed:
May. 18, 2000
Applicant:
Inventors:
Jonathan Apollo Kung, Oakland, CA (US);
Vadim Matov, Campbell, CA (US);
Assignee:
Cyra Technologies, Inc., San Ramon, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 1/500 ;
U.S. Cl.
CPC ...
G06T 1/500 ;
Abstract
An apparatus and method are described for forming 2D views of a structure from 3D point data. In the present invention, a plane is specified and triangulated meshes are intersected with the plane to form a group of polylines. The significant features of each polyline are then extracted, and the features are then connected to form intersection polylines that closely approximate the intersection polylines that would be generated by intersecting the real 3D structure with the specified plane. The final 2D view consists of the connected features extracted from the polylines.