The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2003

Filed:

May. 04, 2001
Applicant:
Inventors:

Junichi Katagiri, Naka, JP;

Yoshitaka Takezawa, Hitachinaka, JP;

Yuzo Ito, Mito, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/135 ;
U.S. Cl.
CPC ...
G01N 2/135 ;
Abstract

A measurement method and apparatus, which are capable of simply measuring the water content of an object with a high degree of accuracy, is characterized by irradiating the surface of the object with at least two monochromatic light beams having different wave length values, one of the wave length values being less than 1350 nm; measuring the intensity of light for each of the light beams reflected from the surface of the object using a light intensity-measurement unit; obtaining the reflective absorbance (A ) of each light beam; calculating a reflective-absorbance differences (&Dgr;A ) between, or a reflective-absorbance ratio (A ′) of, the respective light beams, respectively; and estimating the water content of the measured object by using the relationship between water content and the reflective-absorbance differences or reflective-absorbance ratio, which relationship stored in a memory device in advance.


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