The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2003

Filed:

Feb. 20, 2001
Applicant:
Inventors:

John Haig Marsh, Glasgow, GB;

Craig James Hamilton, Ralston, Renfrewshire, GB;

Stuart Duncan McDougall, Hazelbank, Lanark, GB;

Olek Peter Kowalski, Paisley, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/100 ;
U.S. Cl.
CPC ...
H01L 2/100 ;
Abstract

There is disclosed an improved method of manufacturing of an optical device ( ), particularly semiconductor optoelectronic devices such as laser diodes, optical modulators, optical amplifiers, optical switches, and optical detectors. The invention provides a method of manufacturing optical device ( ), a device body portion ( ) from which the device ( ) is to be made including a Quantum Well (QW) structure ( ), the method including the step of: processing the device body portion ( ) so as to create extended defects at least in a portion ( ) of the device portion ( ). Each extended defect is a structural defect comprising a plurality of adjacent “point” defects.


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