The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2003
Filed:
Oct. 12, 2001
John Patrick Kaufhold, Altamont, NY (US);
John Eric Tkaczyk, Delanson, NY (US);
Dinko E. Gonzalez Trotter, Clifton Park, NY (US);
Jeffrey Wayne Eberhard, Albany, NY (US);
Jerry A. Thomas, Potomac, MA (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for calibration of an imaging system includes providing a calibration phantom system including a first phantom element material block having a first surface at a first height, wherein the first phantom element material block at least partially includes a first material having a first attenuation coefficient. Providing a calibration phantom system also includes providing a second phantom element material block having a second surface at a second height different than the first height, the second phantom element material block at least partially including a second material having a second attenuation coefficient different than the first attenuation coefficient, wherein the first phantom element material block and said second phantom element material block are co-positioned on a detector. The method also includes imaging the calibration phantom system to obtain phantom images, processing the phantom images, and extracting a plurality of calibration values from the processed phantom images.