The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2003

Filed:

Apr. 18, 2001
Applicant:
Inventor:

Jun Nagasawa, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/520 ;
U.S. Cl.
CPC ...
G01N 2/520 ;
Abstract

With input compensation-type differential scanning calorimeters of the related art, the power supplied fluctuated even with non-endothermic reference materials, and the reference material side temperature therefore also fluctuated. Mutual interference between feedback loops also made precise temperature control difficult. In the present invention, power supplied to the sample side is changed to compensate for a temperature difference between the sample side and the reference material side using a differential thermal feedback loop, power to be supplied to the reference material side heater to make the reference material side temperature correspond to the program temperature is controlled, and the same amount of the power is also supplied to the sample side with the average temperature feedback loop. Further, in the present invention, the power supplied to heat reservoir the sample side is changed to compensate for a temperature difference between the sample side and the reference material side using a differential thermal feedback loop, and the average temperature feedback loop controls the heat reservoir surrounding the sample and the reference material to make it correspond to the program temperature.


Find Patent Forward Citations

Nagasawa, Jun. (2003). Thermal analysis apparatus (U.S. Patent No. 6632015). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6632015

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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