The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2003
Filed:
Aug. 31, 2001
Allan Wirth, Bedford, MA (US);
Adaptive Optics Associates, Inc., Cambridge, MA (US);
Abstract
An improved ophthalmic instrument including a wavefront sensor that estimates aberrations in reflections of the light formed as a spot image on the retina of the human eye, wherein the wavefront sensor includes at least one subaperture that spatially samples incident light; at least one optical element that focuses each sample to a spot; and an image sensor and image processor for measuring location of the spot. The image sensor captures image data of an pixel subaperture defined around the spot and provides the image data to the image processor. The image processor analyzes the image data to identify a subarray of pixels around a peak in the pixel subaperture, fits a predetermined function to the image data for the subarray of pixels, and derives an estimate for spot location based upon location of the fit of the predetermined function. The ophthalmic instrument may further include a phase compensator, operably coupled to the wavefront sensor, that spatially modulates the phase of incident light to compensate for the aberrations estimated by the wavefront sensor, and a display device that displays a graphical representation of aberrations of the eye based upon the aberrations estimated by the wavefront sensor. The wavefront sensor preferably includes a monolithic lenslet array having a plurality of lenslets each sampling different spatial parts of an incident light beam and focusing the samples to spots.