The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2003
Filed:
Apr. 26, 2002
Joseph B. Seale, Gorham, ME (US);
Other;
Abstract
A materials characterization method models dynamic, non-linear, temperature-dependent stress, strain, hysteresis, creep, and loss of elasticity at high strain, both in test samples and in Finite Element Analysis (FEA). Incorporating universal properties of statistical mechanics and adapting domain models from ferromagnetics to the higher-dimensional realm of stress tensors, the model is applicable to polymers, rubbers, liquids, and metals in elastic and plastic deformation. The model quantifies the dynamics of both plastic and brittle failure. Apparatus and methods are shown for testing material samples and matching the computational model to sample characteristics, leading to a set of characterizing parameters and predictive simulations using those parameters. Though apparatus and testing protocols of the invention yield optimum characterizations, pre-existing data from conventional testing yield useful results.