The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2003

Filed:

Feb. 18, 1999
Applicant:
Inventor:

William David Maitland, Arlington, MA (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/00 ;
U.S. Cl.
CPC ...
G01B 5/00 ;
Abstract

An insulated strain gage including a layer of semiconductive material and a layer of insulating material, where a side of the first insulating layer is disposed adjacent to a side of the semiconductive layer. A method of manufacturing the insulated strain gage includes the steps of forming an insulating layer of insulating material, and depositing a semiconductive layer of semiconductive material on top of the first insulating layer. The bottom side of the semiconductive layer is adjacent to a top side of the insulating layer. The insulated strain gage may be part of an apparatus for measuring strain on an object. The apparatus measures the strain on an object by translating deformations of the object resulting from an applied force into electrical signals. The apparatus includes a sensor, a insulated strain gage, and a circuit. The insulated strain gage includes an insulating layer and is bonded to the mechanical sensor by an adhesive. The circuit is connected to the insulated strain gage and receives signals indicating an electrical value of the insulated strain gage.


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