The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2003
Filed:
Nov. 23, 1999
Jeng-nan Shiau, Webster, NY (US);
Raymond J. Clark, Webster, NY (US);
Stuart A. Schweid, Pittsford, NY (US);
Terri A. Clingerman, Palmyra, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
A method and apparatus are provided for determining a weighted average measured reflectance parameter R for pixels in an image for use in integrated cavity effect correction of the image. For each pixel of interest P in the image, an approximate spatial dependent average A , B of video values in a region of W pixels by H scan lines surrounding the pixel of interest P is computed by convolving video values V of the image in the region with a uniform filter. For each pixel of interest P a result of the convolving step is used as the reflectance parameter R . The apparatus includes a video buffer for storing the pixels of the original scanned image, and first and second stage average buffers for storing the computed approximate spatial dependent averages A , B . First and second stage processing circuits respectively generate the first and second stage average values A , B by convolving the video values of the image in a preselected region with a uniform filter.