The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2003

Filed:

Nov. 26, 2001
Applicant:
Inventor:

Kentaro Nagayama, Osaka, JP;

Assignee:

Konami Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A63F 1/300 ;
U.S. Cl.
CPC ...
A63F 1/300 ;
Abstract

To judge impacts with a three-dimensional model constituted by a plurality of polygons, rapidly and accurately. The vertex-coordinates of the partial models constituting the three-dimensional model are represented by central-coordinates being the average values of the maximum values and minimum values of respective coordinate components, an expansion factor for achieving prescribed values by multiplication by the differentials between the maximum values and minimum values of each coordinate component, and converted vertex-coordinates obtained by subtracting the central-coordinates from the respective vertex-coordinates and then multiplying by the expansion factor; the central-coordinates and the expansion factor being stored as floating-point values, and the converted vertex-coordinates being stored as integers (ST ). Moreover, a judgement subject partial model, being a partial model of the partial models constituting the three-dimensional model to which impact judgement is to be applied, is selected (ST ), and impact judgement is performed with respect to this judgement subject partial model (ST -ST ).


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