The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2003
Filed:
Mar. 08, 2002
Applicant:
Inventors:
Neil Evan Goodzeit, Princeton, NJ (US);
Xipu Li, San Jose, CA (US);
Assignee:
Lockheed Martin Corporation, Bethesda, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B64G 1/36 ;
U.S. Cl.
CPC ...
B64G 1/36 ;
Abstract
A method for correcting differences in measurements between sensors. Misalignment of a roll error of a sun sensor alignment is estimated with respect to a reference roll value measured by an earth sensor. Sun sensor assembly elevation angle residual is calculated utilizing the estimated sun sensor assembly roll misalignment. A yaw attitude of the spacecraft is updated based upon the calculated sun sensor assembly elevation residual.