The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2003
Filed:
Sep. 26, 2000
Applicant:
Inventors:
Timothy G. McNamara, Fishkill, NY (US);
William V. Huott, Holmes, NY (US);
Timothy J. Koprowski, Newburgh, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 2/900 ; G01R 3/128 ; G01R 3/102 ;
U.S. Cl.
CPC ...
G11C 2/900 ; G01R 3/128 ; G01R 3/102 ;
Abstract
This invention describes a method and apparatus, contained within an integrated circuit, for isolating failure by precisely controlling the number of clocks applied during built-in self-test (BIST). A programmable clock counter, on the integrated circuit, stores a specified number of clock cycles and sends a signal to stop a BIST engine once the specified number of clock cycles have been generated. The intermediate results can then be mapped bit by bit in order to isolate the cause of failure.