The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2003
Filed:
Sep. 25, 2000
Applicant:
Inventors:
Timothy J. Koprowski, Newburgh, NY (US);
William V. Huott, Holmes, NY (US);
Timothy G. McNamara, Fishkill, NY (US);
Pradip Patel, Poughkeepsie, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 3/128 ; G01B 3/102 ;
U.S. Cl.
CPC ...
G01B 3/128 ; G01B 3/102 ;
Abstract
An exemplary embodiment of the invention is a method and apparatus for delaying the start of an array built-in self-test (ABIST) until after the ABIST memory arrays have been started. The length of the delay is determined by the value in a programmable delay located on the integrated circuit. The initiation of the ABIST test is delayed by the time specified in the programmable delay.