The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2003
Filed:
Jul. 23, 2001
Toshihiko Tanaka, Komagane, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A defect inspection data processing system includes a client computer having an image pickup section for picking up a two-dimensional image of a to-be-inspected object to be processed in a manufacturing process, and a data transfer section for transferring data indicative of the image picked by the image pickup section. A database stores image data transferred from the client computer. The system also includes a host computer having a defect extraction section for extracting defect information from the image data stored in the database, and a good/bad judgment section for judging whether or not the to-be-inspected object is good, on the basis of the defect information extracted by the defect extraction section. The client computer is separate from the host computer and connected thereto via a communication line.