The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2003
Filed:
Apr. 27, 2000
Applicant:
Inventor:
Yongdong Wang, Wilton, CT (US);
Assignee:
PerkinElmer Instruments LLC, Shelton, CT (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/100 ; G06F 1/900 ;
U.S. Cl.
CPC ...
G01N 3/100 ; G06F 1/900 ;
Abstract
A method and apparatus is provided for detecting an impurity in a sample where an index can be calculated to assess purity in the presence of n major components with signal averaging or noise-filtering automatically built-in. The method and apparatus can be applied to liquid chromatography impurity detection using UV-VIS spectrophotometry based on robust matrix algebra representing the entire spectral space generated by the sample.