The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2003
Filed:
Aug. 31, 2000
Thomas Edwin Turicchi, Jr., Dallas, TX (US);
Doug Grumann, Citrus Heights, CA (US);
Steven R Landherr, Dallas, TX (US);
Michael Richard Carl, Plano, TX (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A method for the automatic selection of computer system parameter values to improve system performance as workload on the system changes. Methods are disclosed for automatically making minor adjustments to computer system parameters and comparing long-term associated performance changes in order to set parameter values so as to obtain improved system performance. The time frame over which a change in a system parameter and the associated system performance change is averaged is adjustable, thus permitting evaluation over shorter or longer periods of times as deemed appropriate. An objective measure of system performance is defined prior to implementation of the present methods. For transaction based systems, average system response-time for a given demand on the system could be, for example, such a measure. For systems executing batch-type workloads, system throughput may be used as the indicator of how well the system is performing.