The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2003
Filed:
Nov. 24, 1999
Shoji Kondo, Hitachinaka, JP;
Hitoshi Sasabuchi, Mito, JP;
Hiroyuki Suzuki, Hitachinaka, JP;
Keiji Tsukada, Kashiwa, JP;
Akihiko Kandori, Kokubunji, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In the present invention, when measuring magnetism of a measuring portion of a patient by making use of a dewar incorporating magnetism sensors each including a super conducting quantum interference device, a bed is at first positioned outside a position immediately below the dewar. At this position outside the position immediately below the dewar the patient is laid on the bed in an inspection posture. Marks are attached on the body of the patient at three points for setting X and Y axis coordinate on the measurement portion, at the position outside the position immediately below the dewar cross shaped beam patterns are projected and the position of the bed is adjusted so that the marks at the three points locate on the cross shaped beam patterns, thereafter, bed is transferred by a constant amount to the position immediately below the dewar. Thereby, in the biomagnetism measurement the correlated position between the dewar (magnetism sensors) and the measurement portion of the patient can be ascertained easily and accurately.