The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2003

Filed:

Oct. 08, 1999
Applicant:
Inventors:

Robert K. Rowe, Corrales, NM (US);

William A. Miller, Santa Fe, NM (US);

Nanxiang Ge, Newtown, PA (US);

Mark Ries Robinson, Albuquerque, NM (US);

Assignee:

Lumidigm, Inc., Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

Methods and apparatus for non-invasively verifying human identities using near-infrared spectroscopy. Near-infrared tissue spectra can be obtained by projecting near-infrared radiation into skin on the underside of human forearms and capturing the light reflected back and out through the tissue. The tissue spectrum collected preferably includes primarily diffuse reflected light reflected from the inner dermis. Multiple tissue spectra and identities can be collected from individuals for whom identity verification may later be desired. The tissue spectra for each individual can be analyzed on a computer, and the spectra for each individual clustered or classified together using tools such as linear discriminant analysis. A target individual seeking identity verification can submit both a purported identity and a near-infrared tissue spectrum for analysis through near-infrared spectroscopy of the forearm. Similarity between the target spectrum and the multiple spectra for the purported identity in the spectral database is determined and identify verified or not verified based on the degree of similarity.


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