The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2003

Filed:

Jul. 02, 2001
Applicant:
Inventors:

Martin Annis, Cambridge, MA (US);

Richard Adler, Albuquerque, NM (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 ;
U.S. Cl.
CPC ...
A61B 6/00 ;
Abstract

A digital tomography system includes an electron source that provides a beam of electrons, and an electromagnet assembly that receives said beam of electrons and is configured and arranged to direct the beam of electrons along a selected path, wherein the assembly provides a redirected beam of electrons. The system also includes a target that is struck by the redirected beam of electrons and generates a cone of x-rays, and a slit collimator that receives the cone of x-rays and generates a fan beam. A first line of detectors is positioned to detect x-rays that pass through the object under inspection, and provide sensed signals indicative thereof to a controller that receives the sensed signals and forms a displayable image of a selected plane through the object under inspection.


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