The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2003
Filed:
Nov. 02, 1999
Robert Scott Appleton, Madison, AL (US);
Andrew L. Plankenhorn, Hazel Green, AL (US);
Paul E. Calvert, Lacey's Spring, AL (US);
Steven Creg Killen, Madison, AL (US);
Adtran Inc., Huntsville, AL (US);
Abstract
A bit error rate test (BERT) system is configured as a field programmable gate array that emulates multiple independent BERT generators. The BERT generators produce test frames containing test pattern codes associated with respectively different time division multiplexed (TDM) digital communication channels, that are not necessarily mutually contiguous within a plurality of TDM timeslots of a network communication frame serving digital communication circuits. A framing unit assembles the test code patterns into a test frame and transmits the test frame over a serial network interface to a plurality of digital channel units of a channel bank. The framing unit also interfaces contents of test code patterns within test frames returned from the channel units over the serial network interface with a plurality of data channel-specific virtual BERT receivers, associated with respective digital communication channels. A bit error processor determines errors in the contents of the test code patterns within returned test frames.