The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2003

Filed:

Mar. 16, 2001
Applicant:
Inventors:

Edward I. Chaleff, Doylestown, PA (US);

Thomas J. Brobst, Allentown, PA (US);

Assignee:

Accu-Sort Systems, Inc., Hatfield, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/608 ;
U.S. Cl.
CPC ...
G02B 2/608 ;
Abstract

A system for scanning objects having a linear array sensor, adapted to detect light input signals, is provided. A lens is optically connected to the linear array sensor, and is adapted to receive and transmit an optical image located in a field of view along a lens axis to the linear array sensor. A light source is used to generate an illumination stripe. A cylindrical lens is positioned between the light source and an object to be scanned. The cylindrical lens is adapted to collect, transmit and focus light from the light source to form the illumination stripe. The linear array sensor, lens axis, and illumination stripe are co-planar and parallel.


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