The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2003

Filed:

Jun. 19, 2000
Applicant:
Inventors:

Kyu Takada, Osaka, JP;

Nozomu Inoue, Nagano, JP;

Takeshi Sowa, Nagano, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/608 ;
U.S. Cl.
CPC ...
G02B 2/608 ;
Abstract

A multi-beam optical scanner includes shaping optics ( ) by which a plurality of light beams issued from light emitting portions ( ) are shaped to be substantially parallel in a primary scanning direction, a deflector having reflecting faces ( ) that reflect and deflect the plurality of light beams and scanning optics ( ) by which the plurality of light beams reflected and deflected by the reflecting faces ( ) are scanned across a plane ( ) to be scanned as a plurality of adjacent beam spots, wherein the distance from the rear principal plane of the shaping optics ( ) to the front principal plane of the scanning optics is expressed by f +f , where f and f are the focal lengths of the shaping optics ( ) and the scanning optics ( ), respectively, in the primary scanning direction.


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