The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2003

Filed:

Jun. 13, 2001
Applicant:
Inventors:

David C. Sayers, Bremerton, WA (US);

Robert M. Blommel, Kingsland, GA (US);

Robert E. Kilthau, Bremerton, WA (US);

Erik A. Keeney, Poulsbo, WA (US);

Nicole F. Rosales, Bremerton, WA (US);

Daren C. Davis, Granbury, TX (US);

Assignee:

Lockheed Martin Corporation, Dallas, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/102 ;
U.S. Cl.
CPC ...
G01B 1/102 ;
Abstract

An apparatus capable of testing a displacement transducer having an extendable portion includes a slide capable of being moved along an axis and a measuring unit capable of determining a displacement of the slide along the axis. The extendable portion is connectible to the slide so that, when the extendible portion is connected and the slide is moved, the extendable portion is extended and retracted along a path. A method capable of testing a displacement transducer includes determining electrical signal values outputted from the transducer corresponding to displacements of the transducer and creating a statistical model based upon the electrical signal values and the displacements of the transducer. The method further includes determining a displacement error for each of the electrical signal values and the displacements of the transducer based upon the statistical model. Displacement errors that exceed a predetermined tolerance are determined.


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