The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2003
Filed:
Jun. 10, 1999
Masamichi Sudo, Tokyo, JP;
Morihiro Sudo, Tokyo, JP;
Daiko Seiko Ltd., Tokyo, JP;
Abstract
A rubber product inspection method for inspecting internal flaws and/or surface defects of a vulcanized transparent or translucent rubber product includes: irradiating illumination light onto the rubber product, so that the light transmitted through the rubber product can be picked-up; and determining an absence or presence of internal flaws of the rubber product, based on an image of the transmitted light picked-up by an image pickup device. An inspection apparatus for executing the inspection method includes a transparent or translucent table on which the rubber product in placed; at least one light source and an image pickup CCD camera which are provided on opposite sides of the table.