The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2003
Filed:
Dec. 29, 2000
Chao-Nan Xu, Tosu, JP;
Morito Akiyama, Tosu, JP;
Kazuhiro Nonaka, Tosu, JP;
Tadahiko Watanabe, Saga, JP;
Agency of Industrial Science and Technology, Tokyo, JP;
Abstract
This invention is to provide a method and a system which, by making use of a stress luminescent material, renders it possible to directly observe a stress distribution on the base of a real time without electrical contacts, and to easily measure a stress or a stress distribution and a stress image. Essentially, the invention comprises the steps of adding a stress to a tested body containing a stress luminescent material whose light emission is proportional to the stress, making visually observable a stress distribution over the tested body in accordance with a luminous intensity of the stress luminescent material contained in the tested body, measuring the luminous intensity of the luminescent material of the tested body, comparing the measured value of the luminous intensity with certain correlation data indicating a relationship between the luminous intensity of the stress luminescent material and a stress, thereby obtaining a stress value or a stress distribution over the tested body.