The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2003

Filed:

Mar. 15, 2001
Applicant:
Inventors:

Gengsheng Lawrence Zeng, Sandy, UT (US);

Daniel Gagnon, Twinsburg, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/166 ;
U.S. Cl.
CPC ...
G01T 1/166 ;
Abstract

&ggr;-ray emissions ( ) are detected by a rotating, one-dimensional detector array ( ). Slats of a convergent or divergent collimator ( ) are mounted between detector elements. The slats are canted by an angle &agr; from focusing on a focal spot ( ) on a perpendicular bisector to the detector array. As a detector head ( ) revolves around a longitudinal axis ( ) of the subject, the head is canted (FIG. ) to generate angularly offset data sets. Data sets with the detector array rotated to 180° opposite orientations are processed ( ) to generate a first derivative data set. Parallel lines or planes ( ) of the canted data sets are processed ( ) to generate a second derivative data set which is backprojected ( ) in accordance with the Radon transform into a three-dimensional image representation.


Find Patent Forward Citations

Loading…