The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2003
Filed:
Apr. 18, 2001
Robert G. Chapman, Burlingame, CA (US);
John Hefti, San Francisco, CA (US);
Barrett J. Bartell, Pacifica, CA (US);
Mark A. Rhodes, Redwood City, CA (US);
Min Zhao, Foster City, CA (US);
Tyler Palmer, San Francisco, CA (US);
Signature Bioscience, Inc., San Francisco, CA (US);
Abstract
The present invention provides a method for detecting a molecular event, comprising (1) applying an electromagnetic test signal to a sample in which a molecular event is being detected, whereby the sample interacts with and modulates the test signal to produce a modulated test signal, and (2) detecting the modulated test signal, wherein the applying and detecting take place in a temperature-controlled environment, wherein the temperature-controlled environment comprises the sample, a radiating portion of a signal generating circuit, and a receiving portion of a signal detection circuit and wherein the applying and detecting take place in the environment at a temperature controlled to within ±0.5° C.