The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2003

Filed:

Jun. 09, 1999
Applicant:
Inventors:

Takeshi Uemura, Miyanohigashi-machi, JP;

Akihiro Hirano, Miyanohigashi-machi, JP;

Juichiro Ukon, Miyanohigashi-machi, JP;

Assignee:

Horiba, Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/112 ;
U.S. Cl.
CPC ...
G01N 3/112 ;
Abstract

The present invention discloses a system for analyzing elements contained in a sample in very slight amounts, such as C, S, O, N, H and the like in materials, such as steel and ceramics. An element analyzer can gasify the sample elements in an appropriate gas, such as oxygen gas in a high-frequency heating furnace or an electric resistant furnace. Resulting gas can be introduced into a mass spectrometer to permit a quantitative analysis of the sample elements. A metal sample can be levitated and heated and melted with induction current for producing the resultant gas for introduction to a mass spectrometer.


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