The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2003

Filed:

Sep. 17, 2001
Applicant:
Inventors:

Ibolya Bartik-Himmler, Wuppertal, DE;

Hans-Willi Kling, Wuppertal, DE;

Werner Optiz, Langenfeld, DE;

Jens Seemann, Duesseldorf, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 2/200 ;
U.S. Cl.
CPC ...
C23C 2/200 ;
Abstract

The invention relates to a method of controlling a treatment line. According to said method a) a correlation between one or several variable parameters of the chemical and/or physical processes of the treatment line and one or several characteristic values that are characteristic of the success of the treatment is established; rules are derived of this correlation that describe the dependence of the characteristic value or the characteristic values of the variable parameters; the correlation and/or the rules derived therefrom are stored in a control system for the treatment line; b) the one or the several characteristic value(s) is/are measured continuously or discontinuously; c) if said characteristic values deviate from a predetermined standard range of values, the/those variable parameter(s) that is/are most closely correlated with said characteristic value is/are modified in the direction which counteracts the deviation of the characteristic value or the characteristic values from the standard range.


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