The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2003
Filed:
Jun. 12, 2001
Applicant:
Inventor:
Peter Davey, Oxford, GB;
Assignee:
Intertech Development Company, Skokie, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 3/04 ;
U.S. Cl.
CPC ...
G01M 3/04 ;
Abstract
A method and apparatus for measuring a leakage rate for an article using nuclear magnetic resonance includes a source of hyper-polarized gas that is detectable using nuclear magnetic resonance. The hyper-polarized gas is used as a tracer gas. The method for measuring a leakage rate involves injecting hyper-polarized gas into a device under test and determining the leakage rate from the nuclear magnetic resonance measurements of the quantity of gas which passes through the article into a leak test chamber over a given test time period. The hyper-polarized gas is He-3, which is polarized by combining it with an optically pumped vapor of rubidium atoms.