The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2003

Filed:

May. 25, 2001
Applicant:
Inventors:

Jason H. Anderson, Campbell, CA (US);

James L. Saunders, Sunnyvale, CA (US);

Madabhushi V. R. Chari, Milpitas, CA (US);

Sudip K. Nag, San Jose, CA (US);

Rajeev Jayaraman, San Jose, CA (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A method and apparatus for placement into a programmable gate array of I/O design objects having different I/O attributes. The I/O attributes of an I/O design object define the electrical characteristics of the design object. The programmable gate array has a plurality of sites (IOBs) arranged into banks supporting a variety of electrical interface characteristics. In an example embodiment, I/O design objects are placed into IOBs of the programmable gate array by first performing simulated annealing that considers conflicts between I/O attributes of I/O design objects as placed into the IOBs. Then, a bipartite matching is performed using placement results from simulated annealing. Finally, if the bipartite matching does not produce a feasible placement, sets of I/O attributes are assigned to the banks based on the previous placement results, and the bipartite matching process is repeated.


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