The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2003
Filed:
Nov. 01, 2000
William V. Huott, Holmes, NY (US);
Moyra K. Mc Manus, Croton-on-Hudson, NY (US);
Pia Naoko Sanda, Chappaqua, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method is provided for analyzing the functionality of an integrated circuit (IC). The method includes the step of applying a built-in self test (BIST) to the integrated circuit. The BIST includes a plurality of tests that result in the integrated circuit passing and/or failing with respect to predefined criteria. During the applying step, a substrate current of the integrated circuit is measured and analyzed as a function of at least one variable. Also during the applying step, optical emissions of the integrated circuit are measured and analyzed. Defects in the functionality of the integrated circuit are identified, based on at least one of the substrate current and the optical emissions.