The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2003
Filed:
Aug. 03, 1999
Richard F. Man, Palo Alto, CA (US);
Umesh Krishnaswamy, Milford, CT (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
Apparatus and method are described for a testing system that generates tests that share similar failure causing characteristics that can be discovered by a genetic generator quickly without going through the chance or long process of traditional random and exhaustive test generations. The testing system generates random test cases that are applied to a system under test (SUT). These tests are validated to determine whether they cause errors within the SUT. All testing programs that cause an error during the execution of the SUT are collected and are used in the genetic algorithm technique to create other testing programs that share similar characteristics.