The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2003
Filed:
Jul. 13, 2001
Ziaus S. Molla, Santa Clara, CA (US);
Victor DaCosta, Santa Cruz, CA (US);
Seung Ho Hwang, Palo Alto, CA (US);
Baegin Sung, Sunnyvale, CA (US);
Silicon Image, Inc., Sunnyvale, CA (US);
Abstract
A method of testing a circuit having an interface which includes data and clock information where phase jitter is introduced into the clock that produces the clock information. The clock is cycled by increasing the period of the clock for a predetermined number of clock cycles so as to introduce an increasing phase shift advance in the clock. The clock is also cycled by decreasing the period of the clock for a predetermined number of clock cycles so as to introduce an increasing phase shift delay in the clock. The circuit under test is caused to sample the data using a clock derived from the clock information. The sampled data is then compared with reference data to determine the error rate.